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Applied Physics Letters
Article . 1993 . Peer-reviewed
Data sources: Crossref
https://doi.org/10.1109/leosst...
Article . 1993 . Peer-reviewed
Data sources: Crossref
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Ultrafast scanning probe microscopy

Authors: Botkin, D.; Weiss, S.; Ogletree, D.F.; Salmeron, E.M.; Chemla, D.S.;

Ultrafast scanning probe microscopy

Abstract

We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-Å spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.

Country
United States
Keywords

47 Other Instrumentation, Laser Spectroscopy 440800, Time Resolution, Electron Microprobe Analysis, Miscellaneous Instrumentation

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    influence
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
123
Top 10%
Top 1%
Top 1%
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bronze