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</script>Microcrystals are formed after a ripening period when an oligo(cyclohexylidene) oxime derivative is deposited on silicon wafers by spin‐coating. Results are presented related to this behavior, including atomic force microscopy images such as that shown here of crystals that had developed 3 h after deposition of the initial soft layer. AFM and X‐ray diffraction data are compared. magnified image
| citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 4 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
