publication . Article . 2015

Stability of semiconductor memory characteristics in a radiation environment

Fetahović, I.; Vujisić, M.; Stanković, K.; Dolićanin, E.;
Open Access English
  • Published: 01 Jan 2015 Journal: Scientific Publications of the State University of Novi Pazar Series A: Applied Mathematics, Informatics and mechanics (issn: 2217-5539, Copyright policy)
Radiation defects in electronic device can occur in a process of its fabrication or during use. Miniaturization trends in industry and increase in level of integration of electronic components have negative affect on component's behavior in a radiation environment. The aim of this paper is to analyze radiation effects in semiconductor memories and to establish how ion- izing radiation influences characteristics and functionality of semiconductor memories. Both the experimental procedure and simulation have been used to investigate the behavior of irra- diated semiconductor memories. EPROM and EEPROM commercial semiconductor memory samples have been exposed to in...
free text keywords: semiconductor memory, radiation effects, simulation, Electronic component, visual_art.visual_art_medium, visual_art, Materials science, EEPROM, law.invention, law, Optoelectronics, business.industry, business, Semiconductor, Radiation hardening, EPROM, Radiation, Ionizing radiation
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