publication . Article . Conference object . Other literature type . 2005

Large‐signal characterization of microwave power devices

Teyssier, Jean-Pierre; Barataud, D.; Charbonniaud, C.; De Groote, Fabien; Mayer, Markus; Nébus, Jean-Michel; Quéré, Raymond;
Open Access English
  • Published: 21 Jul 2005
  • Publisher: HAL CCSD
  • Country: Italy
Abstract
International audience; This article presents an overview of nonlinear measurement techniques for microwave power devices. Several useful measurement techniques available in Europe are described. Trends, especially in the area of high-power and time-domain measurements, are discussed. A summary of the TARGET (“Top Amplifier Research Group in a European Team”) Network of Excellence (NOE) related tasks is described, in order to show how TARGET can improve the European nonlinear-measurement capabilities. © 2005 Wiley Periodicals, Inc. Int J RF and Microwave CAE 15, 2005
Subjects
free text keywords: ING-INF/01 Elettronica, [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design, Computer Science Applications, Microwave power, Electrical engineering, business.industry, business, Electronic engineering, Time domain, Microwave power amplifiers, Solid state amplifiers, Nonlinear system, Amplifier, Engineering
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publication . Article . Conference object . Other literature type . 2005

Large‐signal characterization of microwave power devices

Teyssier, Jean-Pierre; Barataud, D.; Charbonniaud, C.; De Groote, Fabien; Mayer, Markus; Nébus, Jean-Michel; Quéré, Raymond;