Large-signal characterization of microwave power devices

Article, Conference object English OPEN
Teyssier, Jean-Pierre; Barataud, D.; Charbonniaud, C.; De Groote, Fabien; Mayer, Markus; Nébus, Jean-Michel; Quéré, Raymond;
  • Publisher: Wiley
  • Related identifiers: doi: 10.1002/mmce.20113, doi: 10.6092/unibo/amsacta/1083
  • Subject: [ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics | [ SPI.TRON ] Engineering Sciences [physics]/Electronics | ING-INF/01 Elettronica

International audience; This article presents an overview of nonlinear measurement techniques for microwave power devices. Several useful measurement techniques available in Europe are described. Trends, especially in the area of high-power and time-domain measurements,... View more
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