Single view reflectance capture using multiplexed scattering and time-of-flight imaging

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Zhao, Shuang; Velten, Andreas; Raskar, Ramesh; Bala, Kavita; Naik, Nikhil Deepak;

This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipme... View more
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