publication . Preprint . Article . 2015

Comparative study of optical and magneto-optical properties of normal, disordered, and inverse spinel-type oxides

Vitaly Zviagin; Georgeta Salvan; Rüdiger Schmidt-Grund; Michael Ziese; Michael Lorenz; Dietrich RT Zahn;
Open Access English
  • Published: 29 Apr 2015
Abstract
Comment: Physica Status Solidi B (Accepted 30.09.2015)
Subjects
arXiv: Condensed Matter::Materials SciencePhysics::Optics
free text keywords: Condensed Matter - Materials Science, Physics - Optics
51 references, page 1 of 4

[1] Y. F. Chen, D. Spoddig, and M. Ziese, J. Phys. D: Appl. Phys. 41, 205004 (2008).

[2] F. Schein, H. Wenckstern, H. Frenzel, and M. Grundmann, IEEE Electron Device Lett. 33, 5 (2012).

[3] A. A. Timopheev, A. M. Azevedo, N. A. Sobolev, K. Brachwitz, M. Lorenz, M. Ziese, P. Esquinazi, and M. Grundmann, Thin Solid Films 527, 274 (2013).

[4] D. Venkateshvaran, M. Althammer, A. Nielsen, S. Gepra¨gs, M. S. Ramachandra Rao, S. T. B. Goennenwein, M. Opel, and R. Gross, Phys. Rev. B 79, 134405 (2013).

[5] R. Valenzuela, Phys. Res. Int. 2012, 591839 (2011).

[6] S. Soliman, A. Elfalaky, G. H. Fecher, and C. Felser, Phys. Rev. B 83, 085205 (2011).

[7] K. Brachwitz, T. Bo¨ntgen, M. Lorenz, and M. Grundmann, Appl. Phys. Lett. 102, 172104 (2013).

[8] C. Himcinschi, I. Vrejoiu, G. Salvan, M. Fronk, A. Talkenberger, D. R. T. Zahn, D. Rafaja, and J. Kortus, J. Appl. Phys. 133, 084101 (2013).

[9] W. F. J. Fontijn, P. J. Van der Zaag, M. A. C. Devillers, V. A. M. Brabers, and R. Metselaar, Phys. Rev. B 59, 9 (1997).

[10] H. J. Kim, I. C. Song, J. H. Sim, H. Kim, D. Kim, Y. E. Ihm, and W. K. Choo, J. Appl. Phys. 95, 11 (2004).

[11] H. L. Liu, T. Hauffman, K. Herdewyn, H. Terryn, M. V. Bael, and C. V. Haesendonck, Phys. Rev. B 90, 134414 (2014).

[12] J. G. Cook and M. P. Van Der Meer, Thin Solid Films 144, 174 (1986).

[13] L. Qiao, H. Y. Xiao, H. M. Meyer, J. N. Sun, C. M. Rouleau, A. A. Puretzky, D. B. Geohegan, I. N. Ivanov, M. Yoon, W. J. Weber, and M. D. Biegalski, J. Mater. Chem. C 1, 4632 (2013).

[14] T. Bo¨ntgen, K. Brachwitz, R. Schmidt-Grund, M. Lorenz, and M. Grundmann, J. Appl. Phys. 113, 073503 (2013).

[15] M. Fonin, R. Pentcheva, Yu. S. Dedkov, M. Sperlich, D. V. Vyalikh, M. Scheffler, U. Ru¨diger, and G. Gu¨ntheroldt, Phys. Rev. B 72, 104436 (2005).

51 references, page 1 of 4
Abstract
Comment: Physica Status Solidi B (Accepted 30.09.2015)
Subjects
arXiv: Condensed Matter::Materials SciencePhysics::Optics
free text keywords: Condensed Matter - Materials Science, Physics - Optics
51 references, page 1 of 4

[1] Y. F. Chen, D. Spoddig, and M. Ziese, J. Phys. D: Appl. Phys. 41, 205004 (2008).

[2] F. Schein, H. Wenckstern, H. Frenzel, and M. Grundmann, IEEE Electron Device Lett. 33, 5 (2012).

[3] A. A. Timopheev, A. M. Azevedo, N. A. Sobolev, K. Brachwitz, M. Lorenz, M. Ziese, P. Esquinazi, and M. Grundmann, Thin Solid Films 527, 274 (2013).

[4] D. Venkateshvaran, M. Althammer, A. Nielsen, S. Gepra¨gs, M. S. Ramachandra Rao, S. T. B. Goennenwein, M. Opel, and R. Gross, Phys. Rev. B 79, 134405 (2013).

[5] R. Valenzuela, Phys. Res. Int. 2012, 591839 (2011).

[6] S. Soliman, A. Elfalaky, G. H. Fecher, and C. Felser, Phys. Rev. B 83, 085205 (2011).

[7] K. Brachwitz, T. Bo¨ntgen, M. Lorenz, and M. Grundmann, Appl. Phys. Lett. 102, 172104 (2013).

[8] C. Himcinschi, I. Vrejoiu, G. Salvan, M. Fronk, A. Talkenberger, D. R. T. Zahn, D. Rafaja, and J. Kortus, J. Appl. Phys. 133, 084101 (2013).

[9] W. F. J. Fontijn, P. J. Van der Zaag, M. A. C. Devillers, V. A. M. Brabers, and R. Metselaar, Phys. Rev. B 59, 9 (1997).

[10] H. J. Kim, I. C. Song, J. H. Sim, H. Kim, D. Kim, Y. E. Ihm, and W. K. Choo, J. Appl. Phys. 95, 11 (2004).

[11] H. L. Liu, T. Hauffman, K. Herdewyn, H. Terryn, M. V. Bael, and C. V. Haesendonck, Phys. Rev. B 90, 134414 (2014).

[12] J. G. Cook and M. P. Van Der Meer, Thin Solid Films 144, 174 (1986).

[13] L. Qiao, H. Y. Xiao, H. M. Meyer, J. N. Sun, C. M. Rouleau, A. A. Puretzky, D. B. Geohegan, I. N. Ivanov, M. Yoon, W. J. Weber, and M. D. Biegalski, J. Mater. Chem. C 1, 4632 (2013).

[14] T. Bo¨ntgen, K. Brachwitz, R. Schmidt-Grund, M. Lorenz, and M. Grundmann, J. Appl. Phys. 113, 073503 (2013).

[15] M. Fonin, R. Pentcheva, Yu. S. Dedkov, M. Sperlich, D. V. Vyalikh, M. Scheffler, U. Ru¨diger, and G. Gu¨ntheroldt, Phys. Rev. B 72, 104436 (2005).

51 references, page 1 of 4
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