Trap Assisted Tunneling and Its Effect on Subthreshold Swing of Tunnel FETs

Preprint, Article English OPEN
Sajjad, Redwan Noor; Chern, Winston; Hoyt, Judy L; Antoniadis, Dimitri A;
(2016)
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • Related identifiers: doi: 10.1109/TED.2016.2603468
  • Subject: Condensed Matter - Mesoscale and Nanoscale Physics

We provide a detailed study of the oxide- semiconductor interface trap assisted tunneling (TAT) mechanism in tunnel FETs to show how it contributes a major leakage current path before the band-to-band tunneling (BTBT) is initiated. With a modified Shockley-Read-Hall for... View more
  • References (46)
    46 references, page 1 of 5

    1 A. C. Seabaugh and Q. Zhang, Proceedings of the IEEE 98, 2095 (2010).

    2 U. E. Avci, D. H. Morris, S. Hasan, R. Kotlyar, R. Kim, R. Rios, D. E. Nikonov, I. Young, et al., in Electron Devices Meeting (IEDM), 2013 IEEE International (IEEE, 2013), pp. 33{4.

    3 I. Young, U. Avci, and D. Morris, in Electron Devices Meeting (IEDM), 2015 IEEE International (IEEE, 2015), pp. 25{5.

    4 J. Knoch and J. Appenzeller, Electron Device Letters, IEEE 31, 305 (2010).

    5 J. Appenzeller, Y.-M. Lin, J. Knoch, and P. Avouris, Phys. Rev. Lett. 93, 196805 (2004).

    6 W. Y. Choi, B.-G. Park, J. D. Lee, and T.-J. K. Liu, Electron Device Letters, IEEE 28, 743 (2007).

    7 T. Krishnamohan, D. Kim, S. Raghunathan, and K. Saraswat, in Electron Devices Meeting, 2008. IEDM 2008. IEEE International (IEEE, 2008), pp. 1{3.

    8 K. Jeon, W.-Y. Loh, P. Patel, C. Y. Kang, J. Oh, A. Bowonder, C. Park, C. Park, C. Smith, P. Majhi, et al., in VLSI technology (VLSIT), 2010 symposium on (IEEE, 2010), pp. 121{122.

    9 G. Dewey, B. Chu-Kung, J. Boardman, J. Fastenau, J. Kavalieros, R. Kotlyar, W. Liu, D. Lubyshev, M. Metz, N. Mukherjee, et al., in Electron Devices Meeting (IEDM), 2011 IEEE International (IEEE, 2011), pp. 33{6.

    10 R. Gandhi, Z. Chen, N. Singh, K. Banerjee, and S. Lee, Electron Device Letters, IEEE 32, 437 (2011).

  • Metrics
Share - Bookmark