Unit cell determination of epitaxial thin films based on reciprocal space vectors by high-resolution X-ray diffractometry

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Yang, Ping; Liu, Huajun; Chen, Zuhuang; Chen, Lang; Wang, John;
  • Subject: Condensed Matter - Materials Science

A new approach, based on reciprocal space vectors (RSVs), is developed to determine Bravais lattice types and accurate lattice parameters of epitaxial thin films by high-resolution X-ray diffractometry (HR-XRD). The lattice parameters of single crystal substrates are em... View more
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