OI Fluorescent Line Contamination in Soft X-Ray Diffuse Background Obtained with Suzaku/XIS

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Sekiya, Norio; Yamasaki, Noriko Y.; Mitsuda, Kazuhisa; Takei, Yoh;
(2014)

The quantitative measurement of OVII line intensity is a powerful method for understanding the soft X-ray diffuse background. By systematically analyzing the OVII line intensity in 145 high-latitude Suzaku/XIS observations, the flux of OI fluorescent line in the XIS spe... View more
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