Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

Article, Preprint English OPEN
Alvarez, Jose; Boutchich, M.; Kleider, J. P.; Teraji, T.; Koide, Y.;

International audience; The origin of the high leakage current measured in several vertical-type diamond Schottky devices is conjointly investigated by conducting probe atomic force microscopy (CP-AFM) and confocal micro-Raman/Photoluminescence (PL) imaging analysis. Lo... View more
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