publication . Conference object . 2008

Thermal measurement a requirement for monolithic microwave integrated circuit design

Hopper, Richard; Oxley, C. H.;
Open Access English
  • Published: 01 Jan 2008
  • Country: United Kingdom
Abstract
The thermal management of structures such as Monolithic Microwave Integrated Circuits (MMICs) is important, given increased circuit packing densities and RF output powers. The paper will describe the IR measurement technology necessary to obtain accurate temperature profiles on the surface of semiconductor devices. The measurement procedure will be explained, including the device mounting arrangement and emissivity correction technique. The paper will show how the measurement technique has been applied to study the thermal performance of gallium arsenide (GaAs) MMIC configurations and also to GaAs Gunn diodes.
Subjects
arXiv: Condensed Matter::Materials ScienceAstrophysics::Cosmology and Extragalactic Astrophysics
ACM Computing Classification System: Hardware_INTEGRATEDCIRCUITS
Related Organizations
Powered by OpenAIRE Open Research Graph
Any information missing or wrong?Report an Issue
publication . Conference object . 2008

Thermal measurement a requirement for monolithic microwave integrated circuit design

Hopper, Richard; Oxley, C. H.;