publication . Doctoral thesis . 2014

Strukturelle Methoden zur durchgängigen Diagnose digitaler Automobil-Elektronik im Feld

Cook, Alejandro;
Open Access English
  • Published: 01 Jan 2014
  • Country: Germany
The automotive domain has strongly relied on recent advances in semiconductor technology in order to offer customers a huge amount of appealing features of overwhelming complexity. As traditional functional tests are no longer sufficient to fulfill automotive diagnostic requirements, the analysis of automotive semiconductor failures has become a major quality concern. Semiconductor structural test solutions are already key technologies for the successful manufacturing of any integrated circuit. However, these techniques place stringent constraints on the test application process, which cannot be easily enforced outside the manufacturing environment. The methods ...
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ACM Computing Classification System: ComputerApplications_COMPUTERSINOTHERSYSTEMS
free text keywords: Halbleiter , Diagnose , Kraftfahrzeug, 004, BIST , logic diagnosis , Automotive failure analysis
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