Online fatigue crack growth monitoring with clip gauge and direct current potential drop

Article English OPEN
De Tender, Steven; Micone, Nahuel; De Waele, Wim;
  • Publisher: Ghent University, Laboratory Soete
  • Journal: issn: 2032-7471
  • Publisher copyright policies & self-archiving
  • Subject: Technology and Engineering | Paris law curve | da/dN | a/W-N curve | clip gauge | K-decreasing | Delta K | DCPD | K-increasing

Fatigue is a well-known failure phenomenon which has been and still is extensively studied. Often structures are designed according to the safe-life principle so no crack initiation occurs. Nowadays there is a high emphasis on cost-efficiency, and one might rather opt f... View more
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