publication . Conference object . 2017

High frequency guided wave propagation in monocrystalline silicon wafers

Pizzolato, M.; Masserey, B.; Robyr, J. L.; Fromme, P.;
Open Access
  • Published: 05 Apr 2017
  • Publisher: SPIE
  • Country: United Kingdom
Abstract
Monocrystalline silicon wafers are widely used in the photovoltaic industry for solar panels with high conversion efficiency. The cutting process can introduce micro-cracks in the thin wafers and lead to varying thickness. High frequency guided ultrasonic waves are considered for the structural monitoring of the wafers. The anisotropy of the monocrystalline silicon leads to variations of the wave characteristics, depending on the propagation direction relative to the crystal orientation. Full three-dimensional Finite Element simulations of the guided wave propagation were conducted to visualize and quantify these effects for a line source. The phase velocity (sl...
Related Organizations
21 references, page 1 of 2

[1] Luque, A. and Hegedus, S., [Handbook of Photovoltaic Science and Engineering], Wiley, New York (2011).

[2] Abdelhamid, M., Singh, R. and Omar, M., “Review of microcrack detection techniques for silicon solar cells,” IEEE J. Photovoltaics 4, 514-524 (2014).

[3] Israil, M., Ghani, A. and Kerm, Y., “Non-destructive microcracks detection techniques in silicon solar cell,” Phys. Sci. Int. J. 4, 1073-1087 (2014).

[4] Rose, J.L., “Standing on the shoulders of giants: An example of guided wave inspection,” Mat. Eval. 60, 53-59 (2002).

[5] Fromme, P., “Monitoring of Plate Structures Using Guided Ultrasonic Waves,” AIP Conf. Proc. 975, 78-85 (2008). [OpenAIRE]

[6] Fromme, P., “Health Monitoring of Plate Structures using Guided Waves,” Proc. SPIE 6935, 69350W (2008). [OpenAIRE]

[7] Masserey, B., Raemy, C. and Fromme, P., “High-frequency guided ultrasonic waves for hidden defect detection in multi-layered aircraft structures,” Ultrasonics 54, 1720-1728 (2014). [OpenAIRE]

[8] Chan, H., Masserey B. and Fromme, P., “High frequency guided ultrasonic waves for hidden fatigue crack growth monitoring in multi-layer model aerospace structures,” Smart Mater. Struct. 24, 025037 (2015). [OpenAIRE]

[9] Masserey, B. and Fromme, P., “Fatigue Crack Growth Monitoring using High Frequency Guided Waves,” Struct. Health Monit. 12, 484-493 (2013). [OpenAIRE]

[10] Masserey, B. and Fromme, P., “In-Situ Monitoring of Fatigue Crack Growth using High Frequency Guided Waves,” NDT&E Int. 71, 1-7 (2015). [OpenAIRE]

[11] Song, M.-K. and Jhang, K.-Y., “Crack Detection in Single-Crystalline Silicon Wafer Using Laser Generated Lamb Wave,” Adv. Mater. Sci. Eng. 2013, 950791 (2013). [OpenAIRE]

[12] Chakrapani, S.K., Padiyar, M.J. and Balasubramaniam, K., “Crack detection in full size Cz-silicon wafers using lamb wave air coupled ultrasonic testing (LAC-UT),” J. Nondestruct. Eval. 31, 46-55 (2012).

[13] Maris, H.J., “Enhancement of heat pulses in crystals due to elastic anisotropy,” J. Acoust. Soc. Am. 50, 812-818 (1971).

[14] Kim, K.Y., Bretz, K.C., Every, A.G. and Sachse, W. “Ultrasonic imaging of the group velocity surface about the cubic axis in silicon,” J. Appl. Phys. 79, 1857-1863 (1996).

[15] Audoin, B., Bescond, C. and Deschamps, M., “Measurement of stiffness coefficients of anisotropic materials from pointlike generation and detection of acoustic waves,” J. Appl. Phys. 80, 3760-3771 (1996).

21 references, page 1 of 2
Abstract
Monocrystalline silicon wafers are widely used in the photovoltaic industry for solar panels with high conversion efficiency. The cutting process can introduce micro-cracks in the thin wafers and lead to varying thickness. High frequency guided ultrasonic waves are considered for the structural monitoring of the wafers. The anisotropy of the monocrystalline silicon leads to variations of the wave characteristics, depending on the propagation direction relative to the crystal orientation. Full three-dimensional Finite Element simulations of the guided wave propagation were conducted to visualize and quantify these effects for a line source. The phase velocity (sl...
Related Organizations
21 references, page 1 of 2

[1] Luque, A. and Hegedus, S., [Handbook of Photovoltaic Science and Engineering], Wiley, New York (2011).

[2] Abdelhamid, M., Singh, R. and Omar, M., “Review of microcrack detection techniques for silicon solar cells,” IEEE J. Photovoltaics 4, 514-524 (2014).

[3] Israil, M., Ghani, A. and Kerm, Y., “Non-destructive microcracks detection techniques in silicon solar cell,” Phys. Sci. Int. J. 4, 1073-1087 (2014).

[4] Rose, J.L., “Standing on the shoulders of giants: An example of guided wave inspection,” Mat. Eval. 60, 53-59 (2002).

[5] Fromme, P., “Monitoring of Plate Structures Using Guided Ultrasonic Waves,” AIP Conf. Proc. 975, 78-85 (2008). [OpenAIRE]

[6] Fromme, P., “Health Monitoring of Plate Structures using Guided Waves,” Proc. SPIE 6935, 69350W (2008). [OpenAIRE]

[7] Masserey, B., Raemy, C. and Fromme, P., “High-frequency guided ultrasonic waves for hidden defect detection in multi-layered aircraft structures,” Ultrasonics 54, 1720-1728 (2014). [OpenAIRE]

[8] Chan, H., Masserey B. and Fromme, P., “High frequency guided ultrasonic waves for hidden fatigue crack growth monitoring in multi-layer model aerospace structures,” Smart Mater. Struct. 24, 025037 (2015). [OpenAIRE]

[9] Masserey, B. and Fromme, P., “Fatigue Crack Growth Monitoring using High Frequency Guided Waves,” Struct. Health Monit. 12, 484-493 (2013). [OpenAIRE]

[10] Masserey, B. and Fromme, P., “In-Situ Monitoring of Fatigue Crack Growth using High Frequency Guided Waves,” NDT&E Int. 71, 1-7 (2015). [OpenAIRE]

[11] Song, M.-K. and Jhang, K.-Y., “Crack Detection in Single-Crystalline Silicon Wafer Using Laser Generated Lamb Wave,” Adv. Mater. Sci. Eng. 2013, 950791 (2013). [OpenAIRE]

[12] Chakrapani, S.K., Padiyar, M.J. and Balasubramaniam, K., “Crack detection in full size Cz-silicon wafers using lamb wave air coupled ultrasonic testing (LAC-UT),” J. Nondestruct. Eval. 31, 46-55 (2012).

[13] Maris, H.J., “Enhancement of heat pulses in crystals due to elastic anisotropy,” J. Acoust. Soc. Am. 50, 812-818 (1971).

[14] Kim, K.Y., Bretz, K.C., Every, A.G. and Sachse, W. “Ultrasonic imaging of the group velocity surface about the cubic axis in silicon,” J. Appl. Phys. 79, 1857-1863 (1996).

[15] Audoin, B., Bescond, C. and Deschamps, M., “Measurement of stiffness coefficients of anisotropic materials from pointlike generation and detection of acoustic waves,” J. Appl. Phys. 80, 3760-3771 (1996).

21 references, page 1 of 2
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