Built-In Test Engine For Memory Test

Conference object English OPEN
McEvoy, Paul ; Farrell, Ronan (2004)
  • Publisher: IEEE: Institute of Electrical and Electronics Engineers
  • Subject: Electronic Engineering
    acm: Hardware_MEMORYSTRUCTURES

In this paper we will present an on-chip method for testing high performance memory devices, that occupies minimal area and retains full flexibility. This is achieved through microcode test instructions and the associated on-chip state machine. In additio... View more
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