publication . Conference object . 2017

Temperature and process-aware performance monitoring and compensation for an ULP multi-core cluster in 28nm UTBB FD-SOI technology

Name: Temperature and process-aware performance monitoring and compensation for an ULP multi-core cluster in 28nm UTBB FD-SOI technology
Keywords: embedded systems, integrated circuit design, integrated circuit reliability, low-power electronics, power aware computing, silicon-on-insulator

Luca Benini; Alfio Di Mauro; Antonio Pullini; Davide Rossi; Philippe Flatresse;

Open Access English

Published: 01 Jan 2017

Publisher: IEEE

Country: Italy

Summary

Abstract

Environmental temperature variations, as well as process variations, have a detrimental effect on performance and reliability of embedded systems implemented with deep-sub micron technologies. This sensitivity significantly increases in ultra-low-power (ULP) devices that operate in near-threshold, due to the magnification of process variations and to the strong thermal inversion that affects advanced technology nodes. Supporting an extended range of reverse and forward body-bias, UTBB FD-SOI technology provides a powerful knob to compensate for such variations. In this work we propose a methodology to efficiently compensate, at run-time, these variations. The pr...

Persistent Identifiers

doi: 10.1109/patmos.2017.8106979

Subjects

free text keywords: embedded systems, integrated circuit design, integrated circuit reliability, low-power electronics, power aware computing, silicon-on-insulator, Electronic engineering, Power consumption, Performance monitoring, Environmental temperature, Multi-core processor, Inversion (meteorology), Silicon on insulator, Computer science, Magnification

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