Temperature and process-aware performance monitoring and compensation for an ULP multi-core cluster in 28nm UTBB FD-SOI technology

Conference object English OPEN
Di Mauro, Alfio; Rossi, Davide; Pullini, Antonio; Flatresse, Philippe; Benini, Luca;
  • Identifiers: doi: 10.1109/PATMOS.2017.8106979
  • Subject: embedded systems, integrated circuit design, integrated circuit reliability, low-power electronics, power aware computing, silicon-on-insulator

Environmental temperature variations, as well as process variations, have a detrimental effect on performance and reliability of embedded systems implemented with deep-sub micron technologies. This sensitivity significantly increases in ultra-low-power (ULP) devices tha... View more
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