Using rapid scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude

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Möser, J.; Lips, K.; Tseytlin, M.; Eaton, G.; Eaton, S.; Schnegg, A;

X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for hydrogenated amorphous silicon powder samples. By comparing the resulting signal intensities... View more
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