publication . Article . Other literature type . 2017

Using rapid scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude

J. Möser; Klaus Lips; Mark Tseytlin; Gareth R. Eaton; Sandra S. Eaton; Alexander Schnegg;
Open Access
  • Published: 17 Apr 2017
  • Country: Germany
X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for hydrogenated amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a...
Persistent Identifiers
free text keywords: Methods and concepts for material development, Nuclear and High Energy Physics, Biophysics, Biochemistry, Condensed Matter Physics, Article, Spectral line, Materials science, Detection limit, Spectrometer, Order of magnitude, Rapid scan, Calibration, Amorphous silicon, chemistry.chemical_compound, chemistry, Analytical chemistry, Electron paramagnetic resonance, law.invention, law
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