Совершенствование методики контрольных испытаний комплектующих электрорадиоизделий
Совершенствование методики контрольных испытаний комплектующих электрорадиоизделий
Статья посвящена разработке оптимальной методики отбраковочных испытаний оптоэлектронных транзисторов, которая позволит максимально снизить риск их отказа в приборе на финальных этапах изготовления прибора. The article is devoted to the development of an optimal method for screening tests of optoelectronic transistors, which will minimize the risk of their failure in the device at the final stages of manufacturing the device.
- Tomsk Polytechnic University Russian Federation
комплектующие изделия, defect, оптоэлектронные трансформаторы, дефекты, failure mechanism, отказы, electrical equipment, электрорадиоизделия, отбраковка, контрольные испытания, optoelectronic transistors, screening tests
комплектующие изделия, defect, оптоэлектронные трансформаторы, дефекты, failure mechanism, отказы, electrical equipment, электрорадиоизделия, отбраковка, контрольные испытания, optoelectronic transistors, screening tests
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