High energy-resolution x-ray spectroscopy at ultra-high dilution with spherically bent crystal analyzers of 0.5 m radius

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Rovezzi , Mauro; Lapras , Christophe; Manceau , Alain; Glatzel , Pieter; Verbeni , Roberto;
  • Publisher: HAL CCSD
  • Related identifiers: doi: 10.1063/1.4974100
  • Subject: X-ray emission spectra | X-ray spectroscopy | X-ray absorption spectra | [ PHYS.PHYS.PHYS-INS-DET ] Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]

International audience; We present the development, manufacturing, and performance of spherically bent crystal analyzers (SBCAs) of 100 mm diameter and 0.5 m bending radius. The elastic strain in the crystal wafer is partially released by a “strip-bent” method where the... View more
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