Comparison of on-wafer calibrations using the concept of reference impedance

Conference object English OPEN
Purroy Martín, Francesc ; Pradell i Cara, Lluís (1993)
  • Publisher: . MICROWAVE EXHIBITORS AND PUBLISHERS
  • Related identifiers: doi: 10.1109/EUMA.1993.336729
  • Subject: Capacitance | Reflection | Computer networks | Telecomunicació | Telecommunication | Telecommunications | Capacitors | Impedance measurement | Measurement standards | Calibration | Circuits | :Enginyeria de la telecomunicació [Àrees temàtiques de la UPC] | Error correction
    acm: ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
    arxiv: Astrophysics::Instrumentation and Methods for Astrophysics

A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedance of a given Network Analyzer calibration from the reflection coefficient measurement of a physical open circuit. The method has b... View more
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