Test generation for hierarchical functionalswitching structures

Article Russian OPEN
LYULKIN A.; LINNIK I.;
(2003)
  • Publisher: Харьковский национальный университет радиоэлектроники
  • Journal: Радиоэлектроника и информатика (issn: 1563-0064)
  • Publisher copyright policies & self-archiving
  • Subject:
    acm: Hardware_INTEGRATEDCIRCUITS | Hardware_LOGICDESIGN | Hardware_PERFORMANCEANDRELIABILITY

A problem of test generation for logic CMOS circuits is solved with regard to an extended class of faults. The well-known D-algorithm for test generation for stuck-at faults is extended for transistor stuck-open faults. It is shown that a test for transistor stuck-open ... View more
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