publication . Article . 1998

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Marc Haast; Bruno Stiefel; Thomas Pfaffelhuber; Roger Proksch; Ken Babcock; Cock Lodder; Steve R. Hoon; Margaret Evans Best; Pieter J.A van Schendel; Leon Abelmann; ...
Open Access English
  • Published: 01 Jan 1998 Journal: Journal of magnetism and magnetic materials, volume 190, issue 1-2, pages 135-147 (issn: 0304-8853, Copyright policy)
Abstract
A set of reference samples for comparing the results obtained with different magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with different thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very fine stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using different laser powers. These samples have been imaged in six different laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these different microscopes, tips and measurement meth...
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Subjects
free text keywords: SMI-EXP: EXPERIMENTAL TECHNIQUES, SMI-TST: From 2006 in EWI-TST, TSTNE-Probe-MFM: Magnetic Force Microscope, Magnetic force microscopy, Resolution, Fourier analysis, Low temperature, Magneto-optic, Vacuum, Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Measurement method, Magnetic force microscope, Optics, business.industry, business, Remanence, Microscope, law.invention, law, Laser, Materials science, symbols.namesake, symbols, Image resolution, Magnetic field
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