Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments

Conference object English OPEN
Boch , Jérôme; Saigné , F.; Schrimpf , R.D.; Vaillé , J.-R.; Dusseau , L.; Ducret , S.; Bernard , M. ,; Lorfèvre , E.; Chatry , C.;
(2005)
  • Publisher: HAL CCSD
  • Subject: [ SPI.TRON ] Engineering Sciences [physics]/Electronics
    acm: ComputingMilieux_MISCELLANEOUS

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