Minimizing time for test in integrated circuit

Article English OPEN
Andonova, A. S.; Dimitrov, D. G.; Atanasova, N. G.;
(2004)
  • Publisher: Видавництво Національного університету "Львівська політехніка"

The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and its reduction has been the target of many efforts in the past. This paper proposes a new m... View more