High precision measurement of undulator polarization in the regime of hard x-rays

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Schulze, K. S. ; Uschmann, I. ; Paulus, G. G. ; Marx, B. ; Kämpfer, T. ; Wehrhan, O. ; Wille, H. C. ; Schlage, K. ; Röhlsberger, R. ; Weckert, E. ; Förster, E. ; Stöhlker, T. (2014)
  • Publisher: American Institute of Physics
  • Journal: (issn: 1077-3118)
  • Related identifiers: doi: 10.1063/1.4890584
  • Subject:
    • ddc: ddc:530

We have measured the polarization purity of undulator radiation at 12.9 keV, with hitherto unachievable precision. We could measure a polarization purity of 1.8 × 10−4 by using a silicon channel-cut crystal with six Bragg reflections at 45° as analyzer.
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