publication . Conference object . 2012

Preliminary temperature accelerated life test (ALT) on III-V commercial concentrator triple-junction solar cells

Espinet-González, P.; Carlos Algora; Orlando, V.; Núñez, N.; Vázquez, M.; Bautista, J.; Xiugang, H.; Barrutia, L.; Rey-Stolle, I.; Araki, K.;
  • Published: 01 Jun 2012
  • Country: Spain
Abstract
A quantitative temperature accelerated life test on sixty GaInP/GaInAs/Ge triple-junction commercial concentrator solar cells is being carried out. The final objective of this experiment is to evaluate the reliability, warranty period, and failure mechanism of high concentration solar cells in a moderate period of time. The acceleration of the degradation is realized by subjecting the solar cells at temperatures markedly higher than the nominal working temperature under a concentrator, while the photo-current nominal conditions are emulated by injecting current in darkness. Three experiments at three different temperatures are necessary in order to obtain the ac...
Subjects
free text keywords: Energías Renovables, Telecomunicaciones, Electrónica, Optoelectronics, business.industry, business, Busbar, Short circuit, Physics, Failure mode and effects analysis, Triple junction, Nuclear engineering, Acceleration, Weibull distribution, Concentrator, Gallium arsenide, chemistry.chemical_compound, chemistry, Electrical engineering
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publication . Conference object . 2012

Preliminary temperature accelerated life test (ALT) on III-V commercial concentrator triple-junction solar cells

Espinet-González, P.; Carlos Algora; Orlando, V.; Núñez, N.; Vázquez, M.; Bautista, J.; Xiugang, H.; Barrutia, L.; Rey-Stolle, I.; Araki, K.;