publication . Article . 2017

Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

Cai, Miao; Yang, Daoguo; Huang, J.; Zhang, Maofen; Chen, Xianping; Liang, Caihang; Koh, S.W.; Zhang, Kouchi;
Open Access English
  • Published: 01 Jan 2017
  • Country: Netherlands
<p>The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model is proposed as the statistical model of the color shift (CS) process of LED products. Consequently, a CS mechanism constant is obtained for detecting the consistency of CS mechanisms among various stress-loaded conditions. A statistical procedure with the proposed power model is then derived for the CS paths of LED lamps in step-loaded stress testing. Two types of c...
free text keywords: color shift (CS), degradation mechanism, Light-emitting diodes (LEDs), reliability modeling
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Article . 2017
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