publication . Article . 2017

Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

Cai, Miao; Yang, Daoguo; Huang, J.; Zhang, Maofen; Chen, Xianping; Liang, Caihang; Koh, S.W.; Zhang, Kouchi;
Open Access English
  • Published: 01 Jan 2017
  • Country: Netherlands
Abstract
<p>The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model is proposed as the statistical model of the color shift (CS) process of LED products. Consequently, a CS mechanism constant is obtained for detecting the consistency of CS mechanisms among various stress-loaded conditions. A statistical procedure with the proposed power model is then derived for the CS paths of LED lamps in step-loaded stress testing. Two types of c...
Subjects
free text keywords: color shift (CS), degradation mechanism, Light-emitting diodes (LEDs), reliability modeling
Download from
TU Delft Repository
Article . 2017
Provider: NARCIS
43 references, page 1 of 3

[1] S. Tarashioon et al., “An approach to “Design for reliability” in solid state lighting systems at high temperatures,” Microelectron. Reliab., vol. 52, no. 5, pp. 783-793, 2012.

[2] A. Zukauskas et al., “Firelight LED source: Toward a balanced approach to the performance of solid-state lighting for outdoor environments,” IEEE Photon. J., vol. 6, no. 3, Jun. 2014, Art. no. 8200316. [OpenAIRE]

[3] H. O. Ji, J. E. Yun, J. Y. Su, and Y. R. D, “High-color-quality multipackage phosphor-converted LEDs for yellow photolithography room lamp,” IEEE Photon. J., vol. 7, no. 2, Apr. 2015, Art. no. 1300308.

[4] H. Ye et al., “Two-phase cooling of light emitting diode for higher light output and increased efficiency,” Appl. Therm. Eng., vol. 52, pp. 353-359, 2013.

[5] H. Jin, S. Jin, L. Chen, and S. Cen, “Research on the lighting performance of LED street lights with different color temperatures,” IEEE Photon. J., vol. 7, no. 6, 2015, Art. no. 1601309. doi: 10.1109/JPHOT.2015.2497578.

[6] K. S. Yang, C. H. Chung, C. W. Tua, C. C. Wong, T. Y. Yang, and M. T. Lee, “Thermal spreading resistance characteristics of a high power light emitting diode module,” Appl. Therm. Eng., vol. 70, no. 1, pp. 361-368, 2014.

[7] K. B. Abdelmlek, Z. Araoud, R. Ghnay, K. Abderrazak, K. Charrada, and G. Zissis, “Effect of thermal conduction path deficiency on thermal properties of LEDs package,” Appl. Therm. Eng., vol. 102, pp. 251-260, 2016. [OpenAIRE]

[8] W. D. van Driel and X. J. Fan, Solid State Lighting Reliability. Berlin, Germany: Springer, 2012.

[9] B. M. Song, B. Han, A. Bar-Cohena, M. Arik, R. Sharma, and S. Weaver, “Life prediction of LED-based recess down-light cooled by synthetic jet,” Microelectron. Reliab., vol. 52, no. 5, pp. 937-948, 2012.

[10] J. J. Fan, K. C. Yung, and M. Pecht, “Prognostics of lumen maintenance for high power white light emitting diodes using a nonlinear filter-based approach,” Reliab. Eng. Syst. Safe, vol. 123, no. 3, pp. 63-72, 2014.

[11] C. Qian, X. J. Fan, J. J. Fan, C. A. Yuan, and G. Q. Zhang, “An accelerated test method of luminous flux depreciation for LED luminaires and lamps,” Reliab. Eng. Syst. Safe, vol. 147, pp. 84-92, 2016.

[12] S. H. Park and J. H. Kim, “Lifetime estimation of LED lamp using gamma process model,” Microelectron. Reliab., vol. 57, pp. 71-78, 2015.

[13] S. Koh, W. D. van Driel, and G. Q. Zhang, “Degradation of epoxy lens materials in LED systems,” in Proc. IEEE Conf. Thermal, Mechanical Multi-Phys. Simulation Experiments Microelectron. Microsyst. IEEE, 2011, pp. 1-5.

[14] S. T. Tseng and Z. C. Wen, “Step stress accelerated degradation analysis for highly reliable products,” J. Qual. Technol., vol. 32, no. 3, pp. 209-216, 2000.

[15] M. Cai et al., “Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method,” Microelectron. Reliab., vol. 55, no. 9, pp. 1784-1789, 2015.

43 references, page 1 of 3
Powered by OpenAIRE Open Research Graph
Any information missing or wrong?Report an Issue