Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

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Cai, Miao; Yang, Daoguo; Huang, J.; Zhang, Maofen; Chen, Xianping; Liang, Caihang; Koh, S.W.; Zhang, G.Q.;
  • Subject: color shift (CS) | Light-emitting diodes (LEDs) | degradation mechanism | reliability modeling

<p>The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated deg... View more
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