Test-Access Planning and Test Scheduling for Embedded Core-Based System Chips
Goel, Sandeep Kumar;
Publisher: Eindhoven University Press
Subject: EWI-20041 | IR-48260 | METIS-226911
Advances in the semiconductor process technology enable the creation of a complete system on one single die, the so-called system chip or SOC. To reduce time-to-market for large SOCs, reuse of pre-designed and pre-veried blocks called cores is employed. Like the design ... View more
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