Computer-Aided Test Flow in Core-Based Design

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Zivkovic, V.; Tangelder, R.J.W.T.; Kerkhoff, Hans G.;
  • Publisher: IEEE
  • Subject: IR-16130 | METIS-113015

This paper copes with the test-pattern generation and fault coverage determination in the core based design. The basic core-test strategy that one has to apply in the core-based design is stated in this work. A Computer-Aided Test (CAT) flow is proposed resulting in acc... View more
  • References (12)
    12 references, page 1 of 2

    R. Chandramouli, S . Pateras, ”Testing Systcins on a Chip,” IEEE Specrrum,pages 42-47,November 1996.

    P. Varma, S. Bhatin, “A Srructurcd 'rcst Re-Usc Mclhodology for Systems on Siticon,”Proc, ofrhe I“ IEKE Warhhop on Testing Embedded Core-based Sysiems, Washington D.C, Novcinber 1997, paper 3.1 A. Jas, N.Touba. '“restVector Decompression via Cyclical Scan Chains and Its Applicntion to Testing Cote-Based Designs.” Pruc. Inr. Tmr October 1998, Washington D.C,pages 458-467.

    F. Beenkcr, B. Bennetts, L. Thijssan, Tesithli@ Cottoeprs for Disitul IC's - The Mucro Test Approach, volume 3 of Fronficrs in Elecwonics resling, Kluwer Academic Publishcrs. Boston 1995.

    E.J. Marinissen, G.B.A.tousberg, “Macro Test: A liberal Test Approach for Embedded Heusablc Cares,” Pruc. of d ~ e I” IEEE Workshop on Testing Embcddcd Core-based Systems, Washington D.C,November 1997. paper 1.2.

    IEW P1500 Web Site, hiin://,“ ner.i~ce.o~~a/rrouSJp!. s/~ E.J.Marinissen, R. Arcndscn, G . Bos, H . Uingcmaasc, M.

    Lousberg, C. Wouters, “A Stnicturcd and Scolabk Mechanism for Test Access to Embedded Rcusable Corcs.” Proc. h i , Test Cor.$, October 1998, Washington D.C,pagcs 284-293.

    R. Arendsen. M. husbarg, “Core Based Test for U System on Chip Architecture Framcwork,” h o c of tfie 2”d 1EEF Workqkop on Tesrili& Embedded Cure-based System, Washington D.C.. Ociobcr 1998,paper 5.1.

    IEEE Compurer Socicty, IE.!LE Standard Tesr Accrss Pori and Boimdaiy-Smn Archiiecrrire - U X E Std 1149.I - 1 9 W , IEEH. New York, 1990.

    [lo] Various authors, “Core-hased Test: Cookbook,” Philips Intcrnnt publication. 1998.

    [I I ] V.A, Zivkovic, R.G.J. Arcndsen, “Accurate Fault Covcrage Determination in Corebased Test.” ASGE.STU95.715t5, October 1998, Philips Intcrnnl Documentation.

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