Atomic force microscope with integrated optical microscope for biological applications

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Putman, Constant A.J.; van der Werf, Kees O.; de Grooth, Bart G.; van Hulst, Niek F.; Segerink, Frans B.; Greve, Jan;
(1992)
  • Subject:
    mesheuropmc: genetic structures | macromolecular substances | diagnosis | technology, industry, and agriculture | biological sciences

Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned m... View more
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