publication . Article . 1992

Atomic force microscope with integrated optical microscope for biological applications

Constant A.J. Putman; Kees van der Werf; Bart G. de Grooth; Niek F. van Hulst; Frans B. Segerink; Jan Greve;
Open Access
  • Published: 01 Jan 1992 Journal: Review of Scientific Instruments, volume 63, pages 1,914-1,917 (issn: 0034-6748, eissn: 1089-7623, Copyright policy)
  • Publisher: AIP Publishing
  • Country: Netherlands
Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a specific biological object of interest. Here an AFM is presented which has an incorporated inverted optical microscope. The optical image from the optical microscope is not obscured by the cantilever. Using a XY stage to move the sample, an object is selected with the optical microscope and an AFM image of the selected object can be obtained. AFM images of chromosomes a...
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Medical Subject Headings: genetic structurestechnology, industry, and agriculturemacromolecular substancesdiagnosisbiological sciences
free text keywords: Scanning Hall probe microscope, Conventional transmission electron microscope, Optics, business.industry, business, Microscope, law.invention, law, Optical microscope, Stereo microscope, Magnetic force microscope, Biological specimen, 4Pi microscope
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