publication . Other literature type . Article . 2003

Conductivity, morphology, interfacial chemistry, and stability of poly(3,4‐ethylene dioxythiophene)–poly(styrene sulfonate): A photoelectron spectroscopy study

Crispin, X.; Marciniak, S.; Osikowicz, W.; Zotti, G.; Denier van der Gon, A.W.; Louwet, F.; Fahlman, M.; Groenendaal, L.; Schryver, de, F.C.; Salaneck, W.R.;
  • Published: 01 Nov 2003
  • Publisher: Wiley
  • Country: Netherlands
X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: ...
free text keywords: Physical and Theoretical Chemistry, Materials Chemistry, Polymers and Plastics, Condensed Matter Physics, Polymer chemistry, Ethylene, chemistry.chemical_compound, chemistry, Conductive polymer, Sulfonate, Materials science, Styrene, Organic chemistry, Conductivity, X-ray photoelectron spectroscopy, Indium tin oxide, Polyelectrolyte
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