Field and polarity dependence of time-to-resistance increase in Fe–O films studied by constant voltage stress method

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Eriguchi, Koji; Wei, Zhiqiang; Takagi, Takeshi; Ohta, Hiroaki; Ono, Kouichi;
  • Publisher: American Institute of Physics
  • Journal: Applied Physics Letters, volume 94, issue 1 (issn: 0003-6951)
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  • Subject: electrical conductivity | iron compounds | sputter deposition | switching | thermomechanical treatment | thin films

Constant voltage stress (CVS) was applied to Fe–O films prepared by a sputtering process to investigate a stress-induced resistance increase leading to a fundamental mechanism for switching behaviors. Under the CVS, an abrupt resistance increase was found for both stres... View more
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