Evaluation of Transition Untestable Faults Using a Multi-Cycle Capture Test Generation Method

External research report English OPEN
Yoshimura, Masayoshi ; Ogawa, Hiroshi ; Hosokawa, Toshinori ; Yamazaki, Koji (2010)
  • Publisher: IEEE
  • Journal: Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) 273-276
  • Subject:
    acm: Hardware_LOGICDESIGN | Hardware_PERFORMANCEANDRELIABILITY

Overtesting induces unnecessary yield loss. Untestable faults have no effect on normal functions of circuits. However, in scan testing, untestable faults may be detected through scan chains. Detected untestable faults cause overtesting. Untestable faults consist of unco... View more
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