The Structural Characterisation of Risk in the R&D Process of Functional Raw Materials for Electronic Devices

Conference object English OPEN
Chikamori, Yoji; Nasu, Seigo;
  • Publisher: Society for Social Management Systems
  • Journal: Society for Social Management Systems Internet Journal,volume 10,issue 2 (issn: 2432-552X)
  • Publisher copyright policies & self-archiving
  • Subject: development of functional material | uncertainty and risk | unexpected failure

The electronic materials and electronics device industries remain important to Japan in spite of the general decline of the Japanese electronics industry. There is risk and uncertainty when developing functional materials in the electronics industry. However, studies ex... View more
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