publication . Article . 1993

Atomic imaging of an InSe single-crystal surface with atomic force microscope

Uosaki, Kohei; Koinuma, Michio;
Open Access English
  • Published: 01 Aug 1993 Journal: Journal of Applied Physics, volume 74, issue 3, pages 1,675-1,678 (issn: 0021-8979, Copyright policy)
  • Publisher: American Institute of Physics
The atomic force microscope was employed to observed in air the surface atomic structure of InSe, one of III-VI compound semiconductors with layered structures. Atomic arrangements were observed in both n-type and p-type materials. The observed structures are in good agreement with those expected from bulk crystal structures. The atomic images became less clear by repeating the imaging process. Wide area imaging after the imaging of small area clearly showed that a mound was created at the spot previously imaged. Journal of Applied Physics is copyrighted by The American Institute of Physics.
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Article . 1993
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