Atomic imaging of an InSe single-crystal surface with atomic force microscope

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Uosaki, Kohei; Koinuma, Michio;
(1993)

The atomic force microscope was employed to observed in air the surface atomic structure of InSe, one of III-VI compound semiconductors with layered structures. Atomic arrangements were observed in both n-type and p-type materials. The observed structures are in good ag... View more
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