publication . Article . 1988

Fiber optical laser spot microscope: A new concept for photoelectrochemical characterization of semiconductor electrodes

Carlsson, Per; Holmström, Bertil; Uosaki, Kohei; Kita, Hideaki;
Open Access English
  • Published: 12 Sep 1988 Journal: Applied Physics Letters, volume 53, issue 11, pages 965-967 (issn: 0003-6951, Copyright policy)
  • Publisher: American Institute of Physics
Abstract
A fiber optical laser spot microscope, which allows the simultaneous measurements of photocurrent and reflected light intensity or the measurement of laser spot photocurrent under the illumination of other light sources, has been developed to study semiconductor/electrolyte interfaces. The capability of this microscope was demonstrated on as-cleaved and Pt-treated p-InSe. The Pt treatment increased the photocurrent and improved the lateral resolution due to the increase of surface reaction rate. The higher photocurrent was observed at the spot where the reflectivity was higher. This behavior is considered to be due to an uneven distribution of platinum. The lase...
Download from
JAIRO
Article . 1988
Provider: JAIRO
Powered by OpenAIRE Open Research Graph
Any information missing or wrong?Report an Issue