Fiber optical laser spot microscope: A new concept for photoelectrochemical characterization of semiconductor electrodes

Article English OPEN
Carlsson, Per; Holmström, Bertil; Uosaki, Kohei; Kita, Hideaki;
(1988)
  • Publisher: American Institute of Physics
  • Journal: Applied Physics Letters,volume 53,issue 11,pages965-967 (issn: 0003-6951)

A fiber optical laser spot microscope, which allows the simultaneous measurements of photocurrent and reflected light intensity or the measurement of laser spot photocurrent under the illumination of other light sources, has been developed to study semiconductor/electro... View more
Share - Bookmark

  • Download from
    JAIRO via JAIRO (Article, 1988)
  • Cite this publication