Accuracy of measurement of dynamic surface deformations by the image pattern correlation technique

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Boden, F. ; Kirmse, T. ; Poroikov, A. Yu. ; Rinkevichyus, B. S. ; Skornyakova, N. M. ; Shashkova, I. A. (2014)
  • Journal: Optoelectronics, Instrumentation and Data Processing, volume 50, issue 5, pages 474-481 (issn: 8756-6990, eissn: 1934-7944)
  • Related identifiers: doi: 10.3103/S8756699014050057
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