Review of Polynomial Chaos-Based Methods for Uncertainty Quantification in Modern Integrated Circuits

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Kaintura, Arun; Dhaene, Tom; Spina, Domenico;
(2018)
  • Publisher: MDPI AG
  • Journal: Electronics (issn: 2079-9292)
  • Publisher copyright policies & self-archiving
  • Related identifiers: doi: 10.3390/electronics7030030
  • Subject: STOCHASTIC DIFFERENTIAL-EQUATIONS | uncertainty quantification | Electronics | STEADY-STATE | integrated circuits | MULTIPORT SYSTEMS | dimensionality | PERIODIC | GAUSS QUADRATURE-RULES | VARIABILITY ANALYSIS | COLLOCATION METHODS | NONLINEAR | polynomial chaos | high | high dimensionality | PROBABILITY-MEASURES | LINEAR-REGRESSION | TK7800-8360 | CIRCUITS | TENSOR DECOMPOSITION

Advances in manufacturing process technology are key ensembles for the production of integrated circuits in the sub-micrometer region. It is of paramount importance to assess the effects of tolerances in the manufacturing process on the performance of modern integrated ... View more
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