Wavelet-Based Feature Extraction in Fault Diagnosis for Biquad High-Pass Filter Circuit

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Yuehai Wang; Yongzheng Yan; Qinyong Wang;
(2016)

Fault diagnosis for analog circuit has become a prominent factor in improving the reliability of integrated circuit due to its irreplaceability in modern integrated circuits. In fact fault diagnosis based on intelligent algorithms has become a popular research topic as ... View more
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