Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate

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Hsu, Hung-Pin; Yang, Pong-Hong; Huang, Jeng-Kuang; Wu, Po-Hung; Huang, Ying-Sheng; Li, Cheng; Huang, Shi-Hao; Tiong, Kwong-Kau;
  • Publisher: Hindawi Publishing Corporation
  • Journal: Advances in Condensed Matter Physics (issn: 1687-8108, eissn: 1687-8124)
  • Related identifiers: doi: 10.1155/2013/298190
  • Subject: Physics | QC1-999 | Article Subject

We report a detailed characterization of a Ge/Si0.16Ge0.84 multiple quantum well (MQW) structure on Ge-on-Si virtual substrate (VS) grown by ultrahigh vacuum chemical vapor deposition by using temperature-dependent photoreflectance (PR) in the temperature range from 10 ... View more
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