Radiation Damage in Electronic Memory Devices

Article English OPEN
Fetahović, Irfan; Pejović, Milić; Vujisić, Miloš;
(2013)
  • Publisher: Hindawi Publishing Corporation
  • Journal: International Journal of Photoenergy (issn: 1110-662X)
  • Related identifiers: doi: 10.1155/2013/170269
  • Subject: Article Subject

This paper investigates the behavior of semiconductor memories exposed to radiation in order to establish their applicability in a radiation environment. The experimental procedure has been used to test radiation hardness of commercial semiconductor memories. Different ... View more
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