publication . Article . Other literature type . Preprint . 2015

Impact of low-dose electron irradiation on n+p silicon strip sensors

P. Cariola; J. F. Pernot; Suvadeep Bose; K. Klein; S. Dittmer; H. Mendez; Th. Müller; K. Burt; D. Giordano; Peter Robmann; ...
Open Access English
  • Published: 11 May 2015
Abstract
The response of n+p silicon strip sensors to electrons from a 90Sr source was measured using a multi-channel read-out system with 25 ns sampling time. The measurements were performed over a period of several weeks, during which the operating conditions were varied. The sensors were fabricated by Hamamatsu Photonics on 200 μm thick float-zone and magnetic-Czochralski silicon. Their pitch was 80 μm, and both p-stop and p-spray isolation of the n+ strips were studied. The electrons from the 90Sr source were collimated to a spot with a full-width-at-half-maximum of 2 mm at the sensor surface, and the dose rate in the SiO2 at the maximum was about 50 Gy(SiO2)/d. Afte...
Subjects
ACM Computing Classification System: ComputingMilieux_LEGALASPECTSOFCOMPUTINGData_GENERALComputingMilieux_MISCELLANEOUS
free text keywords: Charge collection; Radiation damage; Silicon strip sensors; Surface damage; Instrumentation; Nuclear and High Energy Physics, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], Detectors and Experimental Techniques, 114 Physical sciences, CMS, density [charge], yield [charge], temperature dependence [damage], electric field, spatial distribution [electric field], irradiation [electron], numerical calculations, damage [radiation], microstrip [semiconductor detector], oxygen [silicon], Physics and Astronomy, Charge collection, Silicon strip sensors, Radiation damage, Surface damage, RADIATION-DAMAGE, DETECTORS, CHARGE, PIXEL, Physique des particules élémentaires, Physics - Instrumentation and Detectors, FISICA DELLE PARTICELLE, Engineering sciences. Technology, Physics, Chemistry, Nuclear and High Energy Physics, Instrumentation, ddc:530, Electron beam processing, Ionization, Radiation, Charge density, Silicon, chemistry.chemical_element, Annealing (metallurgy), Charge sharing, Analytical chemistry, Nuclear physics
Funded by
EC| AIDA
Project
AIDA
Advanced European Infrastructures for Detectors at Accelerators
  • Funder: European Commission (EC)
  • Project Code: 262025
  • Funding stream: FP7 | SP4 | INFRA
Communities
EGI FederationEGI virtual organizations: cms
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