Traceable atomic force microscopy of high-quality solvent-free crystals of [6,6]-phenyl-C61-butyric acid methyl ester

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Lazzerini, GM; Paterno, GM; Tregnago, G; Treat, N; Stingelin, N; Yacoot, A; Cacialli, F;
  • Publisher: AIP Publishing
  • Journal: Applied Physics Letters,volume 108,issue 5,page53,303 (issn: 0003-6951, eissn: 1077-3118)
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  • Related identifiers: doi: 10.1063/1.4941227
  • Subject: MORPHOLOGY | ORGANIC PHOTOVOLTAICS | SINGLE-CRYSTALS | PCBM | Applied Physics | DIMENSIONAL METROLOGY | Physical Sciences | Physics, Applied | 09 Engineering | Science & Technology | Physics | SOLAR-CELLS | 02 Physical Sciences

We report high-resolution, traceable atomic force microscopymeasurements of high-quality, solvent-free single crystals of [6,6]-phenyl-C61-butyric acid methyl ester (PCBM). These were grown by drop-casting PCBM solutions onto the spectrosil substrates and by removing th... View more
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