Surface melting of deuterium hydride thick films

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Zeppenfeld , P. ; Bienfait , M. ; Feng Chuan Liu , ; Vilches , O.E. ; Coddens , G. (1990)
  • Publisher: HAL CCSD
  • Related identifiers: doi: 10.1051/jphys:0199000510170192900
  • Subject: neutron diffraction examination of materials | deuterium | surface diffusion | [ PHYS.HIST ] Physics [physics]/Physics archives | melting | hydrogen | surface phase transformations | thin films

Quasi-elastic neutron scattering has been used to measure, below the bulk melting temperature, the thickness and the diffusion coefficient of the mobile surface layer of 8 and 10 layer thick films of deuterium hydride (HD) condensed on MgO(100). The measurements show that the close-packed surface of solid HD surface melts gradually, with the thickness of the melted layer increasing from 0.5 to 6 molecular layers as the temperature rises from 4 K to 0.05 K below the bulk melting temperature. The diffusion coefficients are in the 10-5 cm2 s-1 range indicating that the surface disordered film is liquid-like.
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