The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

Article English OPEN
Artem Ganiyev; Jan Vitasek;
  • Publisher: VSB-Technical University of Ostrava
  • Journal: Advances in Electrical and Electronic Engineering (issn: 1336-1376, eissn: 1804-3119)
  • Publisher copyright policies & self-archiving
  • Subject: program equipment | memory component | very large scale integration circuit | Electrical engineering. Electronics. Nuclear engineering | TK1-9971 | integrated circuit | telecommunication system. | large scale integration circuit

This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysi... View more
Share - Bookmark