The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

Article English OPEN
Artem Ganiyev ; Jan Vitasek (2010)
  • Publisher: VSB-Technical University of Ostrava
  • Journal: Advances in Electrical and Electronic Engineering (issn: 1336-1376, eissn: 1804-3119)
  • Subject: program equipment | memory component | very large scale integration circuit | Electrical engineering. Electronics. Nuclear engineering | TK1-9971 | integrated circuit | telecommunication system. | Large scale integration circuit

This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits.
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