The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

Article English OPEN
Artem Ganiyev; Jan Vitasek;
(2010)
  • Publisher: VSB-Technical University of Ostrava
  • Journal: Advances in Electrical and Electronic Engineering (issn: 1336-1376, eissn: 1804-3119)
  • Subject: program equipment | memory component | very large scale integration circuit | Electrical engineering. Electronics. Nuclear engineering | TK1-9971 | integrated circuit | telecommunication system. | Large scale integration circuit
    acm: Hardware_INTEGRATEDCIRCUITS | Hardware_LOGICDESIGN | Hardware_PERFORMANCEANDRELIABILITY

This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysi... View more
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