Limitations of the dual voltage clamp method in assaying conductance and kinetics of gap junction channels.

Article, Other literature type English OPEN
Wilders, R.; Jongsma, H. J.;

The electrical properties of gap junctions in cell pairs are usually studied by means of the dual voltage clamp method. The voltage across the junctional channels, however, cannot be controlled adequately due to an artificial resistance and a natural resistance, both co... View more
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