Linear Coefficient of Thermal Expansion of Porous Anodic Alumina Thin Films from Atomic Force Microscopy

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Zhang, Richard X.; Fisher, Timothy; Raman, Arvind; Sands, Timothy D;
  • Publisher: Purdue University
  • Subject: Nanoscience and Nanotechnology | porous anaodic alumina; coefficient of thermal expansion; atomic force microscopy; thin films | Engineering

In this article, a precise and convenient technique based on the atomic force microscope (AFM) is developed to measure the linear coefficient of thermal expansion of a porous anodic alumina thin film. A stage was used to heat the sample from room temperature up to 450 K... View more
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