Assessing microscope image focus quality with deep learning

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Yang, Samuel J; Berndl, Marc; Michael Ando, D.; Narayanaswamy, Arunachalam; Christiansen, Eric; Hoyer, Stephan; Roat, Chris; Rueden, Curtis T; Shankar, Asim; Finkbeiner, Steven; Nelson, Philip; Yang, Samuel J.; Rueden, Curtis T.; Barch, Mariya; Hung, Jane Yen;

Background Large image datasets acquired on automated microscopes typically have some fraction of low quality, out-of-focus images, despite the use of hardware autofocus systems. Identification of these images using automated image analysis with high ... View more
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