SRAM lifetime improvement by using adaptive proactive reconfiguration

Conference object English OPEN
Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio;
  • Publisher: IEEE Press. Institute of Electrical and Electronics Engineers
  • Subject: Circuits integrats | Electrònica | Integrated circuits | :Enginyeria electrònica::Microelectrònica::Circuits integrats [Àrees temàtiques de la UPC]

Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. ... View more
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