publication . Article . Preprint . 2011

A parametrization of the energy loss distributions of charged particles and its applications for silicon detectors

Ferenc Siklér;
Open Access
  • Published: 14 Nov 2011 Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, volume 691, pages 16-29 (issn: 0168-9002, Copyright policy)
  • Publisher: Elsevier BV
Abstract
The energy loss of charged particles in silicon can be approximated by a simple analytical model. With help of measured charge deposits in individual channels of hit clusters their position and energy can be estimated. Deposits below threshold and saturated values are treated properly, resulting in a wider dynamic range. The proposed method gives improvements on both hit position and energy residuals. The model is successfully applied to track differential energy loss estimation and to detector gain calibration tasks.
Subjects
free text keywords: Nuclear and High Energy Physics, Instrumentation, Physics - Data Analysis, Statistics and Probability, High Energy Physics - Experiment, Detectors and Experimental Techniques, Common software tools [2], Reconstruction toolkit for HEP [2.3], Energy loss, Detector, Atomic physics, Parametrization, Probability and statistics, Calibration, Silicon, chemistry.chemical_element, chemistry, Charged particle, Physics
Funded by
SNSF| First years of data taking with the CMS experiment at the LHC
Project
  • Funder: Swiss National Science Foundation (SNSF)
  • Project Code: IZ73Z0_128079
  • Funding stream: Programmes | SCOPES
,
EC| AIDA
Project
AIDA
Advanced European Infrastructures for Detectors at Accelerators
  • Funder: European Commission (EC)
  • Project Code: 262025
  • Funding stream: FP7 | SP4 | INFRA

[1] O. Ullaland, Update in particle identification, Nucl. Phys. Proc. Suppl. 125 (2003) 90-99. doi:10.1016/S0920-5632(03)90972-8.

[2] H. Yamamoto, dE/dx particle identification for collider detectorsarXiv:hep-ex/9912024 .

[3] H. Bichsel, Straggling in thin silicon detectors, Rev. Mod. Phys. 60 (1988) 663-699. doi:10.1103/RevModPhys.60.663 . [OpenAIRE]

[4] K. Nakamura, et al., Review of particle physics, J.Phys.G G37 (2010) 075021. doi:10.1088/0954-3899/37/7A/075021.

[5] H. Bichsel, Inelastic electronic collision cross sections for Monte Carlo calculations, Nucl. Instrum. Meth. B52 (1990) 136. doi:10.1016/0168-583X\%2890\%2990581-E. [OpenAIRE]

[6] H. Bichsel, A method to improve tracking and particle identification in TPCs and silicon detectors, Nucl. Instrum. Meth. A562 (2006) 154-197. doi:10.1016/j.nima.2006.03.009. [OpenAIRE]

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